Browsing by author "Liyang, Pan"

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Assessment methodology of the lateral migration component in data retention of 3D SONOS memories

Liu, Lifang; Arreghini, Antonio; Van den Bosch, Geert; Liyang, Pan; Van Houdt, Jan (2014)
Reliability comparison of ISSG oxide and HTO as tunnel dielectric in 3-D–SONOS applications

Qiao, Fengying; Arreghini, Antonio; Blomme, Pieter; Date, Lucien; Van den Bosch, Geert; Liyang, Pan; Jun, Xu; Van Houdt, Jan (2013)