Browsing by author "Nellist, Peter D."
Now showing items 1-2 of 2
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Single atom detection from low contrast-to-noise ratio electron microscopy images
Fatermans, J.; den Dekker, Arnold Jan; Müller-Caspary, K.; Lobato, Ivan; O'Leary, C. M.; Nellist, Peter D.; Van Aert, Sandra (2018-07) -
The Effect of Dynamical Scattering on Single-plane Phase Retrieval in Electron Ptychography
Clark, Laura; Martinez Alanis, Gerardo Tadeo; OLeary, Colum M.; Yang, Hao; Ding, Zhiyuan; Petersen, Timothy C.; Findlay, Scott D.; Nellist, Peter D. (2023)