Browsing by author "Bosman, Michel"
Now showing items 1-5 of 5
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Controlling the Wet-Etch Directionality in Nanostructured Silicon
Aabdin, Zainul; Ghosh, Tanmay; Pacco, Antoine; Raj, Sanoj; Do, Hue Thi Bich; Saidov, Khakimjon; Weei, Tjiu Weng; Anand, Utkarsh; Kral, Petr; Holsteyns, Frank; Bosman, Michel; Mirsaidov, Utkur (2022) -
Patterning at the Resolution Limit of Commercial Electron Beam Lithography
Saifullah, Mohammad S. M.; Asbahi, Mohamed; Neo, Darren C. J.; Mahfoud, Zackaria; Tan, Hui Ru; Ha, Son Tung; Dwivedi, Neeraj; Dutta, Tanmay; bin Dolmanan, Surani; Aabdin, Zainul; Bosman, Michel; Ganesan, Ramakrishnan; Tripathy, Sudhiranjan; Hasko, David G.; Valiyaveettil, Suresh (2022) -
Physical analysis of beakdown in High-k /metal gate stacks using TEM/EELS and STM for relibaility enhancement
Pey, Kin Leong; Raghavan, Nagarajan; Wu, Xing; Liu, Wenhu; Li, Xiang; Bosman, Michel; Shubhakar, Kalya; Lwin, Zin Zar; Chen, Yining; Qin, Hailang; Kauerauf, Thomas (2011) -
Random telegraph noise reduction in metal gate high-k stacks by bipolar switching and the performance boosting technique
Liu, Wenhu; Pey, Kin Leong; Raghavan, Nagarajan; Wu, Xing; Bosman, Michel; Kauerauf, Thomas (2011) -
Very low reset current for an RRAM device achieved in the oxygen-vacancy-controlled regime
Raghavan, Nagarajan; Pey, Kin Leong; Li, Xiang; Liu, Wenhu; Wu, Xing; Bosman, Michel; Kauerauf, Thomas (2011)