Authors

Liu, Wenhu; Pey, Kin Leong; Raghavan, Nagarajan; Wu, Xing; Bosman, Michel; Kauerauf, Thomas

Conference

IEEE International Reliability Physics Symposium - IRPS

Title

Random telegraph noise reduction in metal gate high-k stacks by bipolar switching and the performance boosting technique

Publication type

Proceedings paper

Embargo date

9999-12-31