Browsing by author "Imai, Yasuhiko"

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Tomographic mapping analysis in the depth direction of high-Ge-content SiGe layers with compositionally graded buffers by nanobeam X-ray diffraction

Shida, Kazuki; Takeuchi, Shotaro; Imai, Yasuhiko; Kimura, Shigeru; Schulze, Andreas; Caymax, Matty; Sakai, Akira (2017)
X-ray microdiffraction measurements to support epitaxial growth studies of strained Ge-cap / relaxed SiGe on STI nano-scale patterned Si wafers

Loo, Roger; Shimura, Yosuke; Sun, Jianwu; Ike, Shinichi; Inuzuka, Yuuki; Nakatsuka, Osau; Zaima, Shigeaki; Imai, Yasuhiko; Kimura, Shigeru (2015)