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X-ray microdiffraction measurements to support epitaxial growth studies of strained Ge-cap / relaxed SiGe on STI nano-scale patterned Si wafers
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2086 since deposited on 2021-10-22
Acq. date: 2026-01-07
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Views
2086 since deposited on 2021-10-22
Acq. date: 2026-01-07
Citations