Browsing by author "Todi, Ravi"
Now showing items 1-3 of 3
-
Low-frequency noise assessment of silicon passivated Ge pMOSFETs with TiN/TaN/HfO2 gate stack
Guo, Wei; Nicholas, Gareth; Kaczer, Ben; Todi, Ravi; De Jaeger, Brice; Claeys, Cor; Mercha, Abdelkarim; Simoen, Eddy; Cretu, B.; Routoure, J.M.; Carin, R. (2007) -
On the origin of the 1/f noise in shallow germanium p+-n junctions
Todi, Ravi; Sonde, Sushant; Simoen, Eddy; Claeys, Cor (2007) -
Processing factors impacting the leakage current and flicker noise of germanium p+-n junctions on silicon substrates
Simoen, Eddy; Sonde, Sushant; Claeys, Cor; Satta, Alessandra; De Jaeger, Brice; Todi, Ravi; Meuris, Marc (2008)