Browsing by author "Rampazzo, Fabiana"
Now showing items 1-2 of 2
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Degradation mechanisms in AlGaN/GaN HEMTs submitted to off and on-state stress conditions
Zanoni, Enrico; Meneghini, Matteo; Stocco, Antonio; Marcon, Denis; Bertin, Marco; Silvestri, Riccardo; Ferretti, Marco; Rampazzo, Fabiana; Meneghesso, Gaudenzio (2012) -
Degradation of GaN-HEMTs with p-GaN Gate: Dependence on temperature and on geometry
Meneghini, Matteo; Rossetto, Isabella; Borga, Matteo; Canato, Eleonora; De Santi, Carlo; Rampazzo, Fabiana; Meneghesso, Gaudenzio; Zanoni, Enrico; Stoffels, Steve; Van Hove, Marleen; Posthuma, Niels; Decoutere, Stefaan (2017)