Degradation mechanisms in AlGaN/GaN HEMTs submitted to off and on-state stress conditions

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Authors
Zanoni, Enrico; Meneghini, Matteo; Stocco, Antonio; Marcon, Denis; Bertin, Marco; Silvestri, Riccardo; Ferretti, Marco; Rampazzo, Fabiana; Meneghesso, Gaudenzio
Conference
6th Space Agency - MOD Workshop on Wideband Gap Semiconductors and Components
Title
Degradation mechanisms in AlGaN/GaN HEMTs submitted to off and on-state stress conditions
Publication type
Proceedings paper
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