Browsing by author "Cardoso Medeiros, Guilherme"

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Device-aware test: A new test approach towards DPPB

Fieback, Moritz; Wu, Lizhou; Cardoso Medeiros, Guilherme; Aziza, Hassen; Rao, Siddharth; Marinissen, Erik Jan; Taouil, Mottaqiallah; Hamdioui, Said (2019-11)
Pinhole defect characterization and modeling for STT-MRAM testing

Wu, Lizhou; Rao, Siddharth; Cardoso Medeiros, Guilherme; Taouil, Mottaqiallah; Marinissen, Erik Jan; Yasin, Farrukh; Couet, Sebastien; Hamdioui, Said; Kar, Gouri Sankar (2019-05)