Browsing by author "Lee, Jam-Wem"
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Impacts of process options on ESD device characteristics in sub-20nm bulk FinFET technology nodes
Chen, Shih-Hung; Lee, Jam-Wem; Linten, Dimitri; Scholz, Mirko; Song, Ming-Hsiang; Hellings, Geert; Boschke, Roman; Sibaja-Hernandez, Arturo; Groeseneken, Guido (2014-12)