Browsing by author "Jian, Yu-Rong"

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Automated Probe-Mark Analysis for Advanced Probe Technology Characterization

Jian, Yu-Rong; Fodor, Ferenc; Wu, Cheng-Wen; Marinissen, Erik Jan (2021)
Solutions to multiple probing challenges for test access to multi-die stacked integrated circuits

Marinissen, Erik Jan; Fodor, Ferenc; Podpod, Arnita; Stucchi, Michele; Jian, Yu-Rong; Wu, Cheng-Wen (2018-11)