Automated Probe-Mark Analysis for Advanced Probe Technology Characterization

View/open

Published version (555.4Kb)

Metadata

Show full item record

Authors

Jian, Yu-Rong; Fodor, Ferenc; Wu, Cheng-Wen; Marinissen, Erik Jan

DOI

10.1109/MDAT.2020.3034043

ISSN

2168-2356

Issue

5

Journal

IEEE DESIGN & TEST

Volume

38

Title

Automated Probe-Mark Analysis for Advanced Probe Technology Characterization

Publication type

Journal article

Embargo date

9999-12-31

Collections

Articles