Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Automated Probe-Mark Analysis for Advanced Probe Technology Characterization
Publication:
Automated Probe-Mark Analysis for Advanced Probe Technology Characterization
Date
2021
Journal article
https://doi.org/10.1109/MDAT.2020.3034043
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
Published version
555.46 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jian, Yu-Rong
;
Fodor, Ferenc
;
Wu, Cheng-Wen
;
Marinissen, Erik Jan
Journal
IEEE DESIGN & TEST
Abstract
Description
Metrics
Downloads
66
since deposited on 2022-03-07
Acq. date: 2025-10-25
Views
1868
since deposited on 2022-03-07
Acq. date: 2025-10-25
Citations
Metrics
Downloads
66
since deposited on 2022-03-07
Acq. date: 2025-10-25
Views
1868
since deposited on 2022-03-07
Acq. date: 2025-10-25
Citations