Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Automated Probe-Mark Analysis for Advanced Probe Technology Characterization
Publication:
Automated Probe-Mark Analysis for Advanced Probe Technology Characterization
Copy permalink
Date
2021
Journal article
https://doi.org/10.1109/MDAT.2020.3034043
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
Published version
555.46 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jian, Yu-Rong
;
Fodor, Ferenc
;
Wu, Cheng-Wen
;
Marinissen, Erik Jan
Journal
IEEE DESIGN & TEST
Abstract
Description
Metrics
Downloads
66
since deposited on 2022-03-07
Acq. date: 2025-12-12
Views
1870
since deposited on 2022-03-07
Acq. date: 2025-12-12
Citations
Metrics
Downloads
66
since deposited on 2022-03-07
Acq. date: 2025-12-12
Views
1870
since deposited on 2022-03-07
Acq. date: 2025-12-12
Citations