Browsing by author "Cron, Adam"
Now showing items 1-5 of 5
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Guest Editors' Introduction: Special Issue on Design and Test of Multidie Packages
Cron, Adam; Jiao, Hailong; Marinissen, Erik Jan (2022) -
IEEE Standard 1838 Is on the Move
Cron, Adam; Marinissen, Erik Jan (2021) -
IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers
Li, Yu; Shao, Ming; Jiao, Hailong; Cron, Adam; Bhatia, Sandeep; Marinissen, Erik Jan (2018-05) -
IEEE Std P1838: 3D test access standard under development
Cron, Adam; Marinissen, Erik Jan; Goel, Sandeep K.; McLaurin, Teresa; Bhatia, Sandeep (2019-03) -
Status report of IEEE P1838 - Standard for test access architecture for three-dimensional stacked integrated circuits
Marinissen, Erik Jan; Cron, Adam (2011)