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Status report of IEEE P1838 - Standard for test access architecture for three-dimensional stacked integrated circuits
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Status report of IEEE P1838 - Standard for test access architecture for three-dimensional stacked integrated circuits
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Cron, Adam
Journal
Abstract
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1900
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Acq. date: 2025-12-12
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Views
1900
since deposited on 2021-10-19
1
last month
1
last week
Acq. date: 2025-12-12
Citations