Browsing by author "Yin, H."
Now showing items 1-10 of 10
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An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method
Zhou, L.; Bo, T.; Ji, Z.; Yang, H.; Xu, H.; Liu, Q.; Simoen, Eddy; Wang, X.; Ma, X.; Li, Y.; Yin, H.; Du, A.; Zhao, C.; Wang, W. (2020) -
Functionalization of CVD diamond films and diamond single crystals for biosensor applications
Saitner, M.; Grieten, L.; Janssens, S.D.; Vanden Bon, N.; Michiels, L.; Yin, H.; D'Haen, Jan; Haenen, Ken; D'Olieslaeger, Marc; Wagner, Patrick; Boyen, Hans-Gerd (2012) -
High-quality cubic BN thin films prepared by rf magnetron sputtering without argonion bombardment
Wang, Q.; Yin, H.; Punniyakoti, S.; Shan, L.; D'Olieslaeger, Marc; Haenen, Ken; Boyen, Hans-Gerd (2012) -
Insights into the effect of TiN thickness scaling on DC and AC NBTI characteristics in replacement metal gate pMOSFETs
Zhou, L.; Liu, Q.; Yang, H.; Ji, Z.; Xu, H.; Tang, B.; Simoen, Eddy; Jiang, H.; Luo, Y.; Wang, X.; Ma, X.; Li, Y.; Luo, J.; Yin, H.; Zhao, C.; Wang, W. (2020) -
Mechanical and tribological properties of epitaxial cubic boron nitride thin films grown on diamond
Deyneka-Dupriez, N.; Herr, U.; Fecht, H.J.; Zhang, X.W.; Yin, H.; Boyen, H.G. (2008) -
Phase separation of ethanol-water solutions at diverse terminated diamond surfaces
Yeap, W.S.; Janssens, S.D.; Yin, H.; Boyen, Hans-Gerd; Larsson, K.; Haenen, Ken (2012) -
Phase separation of ethanol-water solutions at diverse terminated diamond surfaces
Janssens, S.D.; Yeap, W.S.; Drijkoningen, S.; Yin, H.; Boyen, Hans-Gerd; Larsson, K.; Haenen, Ken (2012) -
Purity of epitaxial cubic BoronNitride films on (001) Diamond - A prerequisite for their doping
Yin, H.; Boyen, H.G.; Ziemann, P.; Dohuard, B.; Houssiau, L.; Renaux, F.; Hecq, M.; Bittencourt, C. (2008) -
The influence of diamond surface termination on the phase separation of ethanol-water solutions
Yeap, W.S.; Janssens, S.D.; Yin, H.; Boyen, Hans-Gerd; Larsson, K.; Haenen, Ken (2012) -
Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs
Zhou, L.; Zhang, Q.; Yang, H.; Ji, Z.; Zhang, Z.; Liu, Q.; Xu, H.; Tang, B.; Simoen, Eddy; Ma, X.; Wang, X.; Li, Y.; Yin, H.; Luo, J.; Zhao, C.; Wang, W. (2020)