Authors

Zhou, L.; Zhang, Q.; Yang, H.; Ji, Z.; Zhang, Z.; Liu, Q.; Xu, H.; Tang, B.; Simoen, Eddy; Ma, X.; Wang, X.; Li, Y.; Yin, H.; Luo, J.; Zhao, C.; Wang, W.

ISSN

0741-3106

Issue

7

Journal

IEEE Electron Device Letters

Volume

41

Title

Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs

Publication type

Journal article