Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs

Zhou, L.; Zhang, Q.; Yang, H.; Ji, Z.; Zhang, Z.; Liu, Q.; Xu, H.; Tang, B.; Simoen, Eddy; Ma, X.; Wang, X.; Li, Y.; Yin, H.; Luo, J.; Zhao, C.; Wang, W.

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Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs

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2020

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IEEE Electron Device Letters

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1988 since deposited on 2021-10-29

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Acq. date: 2026-02-27

Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs

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