Authors

Zhou, L.; Bo, T.; Ji, Z.; Yang, H.; Xu, H.; Liu, Q.; Simoen, Eddy; Wang, X.; Ma, X.; Li, Y.; Yin, H.; Du, A.; Zhao, C.; Wang, W.

ISSN

1530-4388

Issue

1

Journal

IEEE Transactions on Device and Materials Reliability

Volume

20

Title

An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method

Publication type

Journal article