An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method

Zhou, L.; Bo, T.; Ji, Z.; Yang, H.; Xu, H.; Liu, Q.; Simoen, Eddy; Wang, X.; Ma, X.; Li, Y.; Yin, H.; Du, A.; Zhao, C.; Wang, W.

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An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method

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2020

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IEEE Transactions on Device and Materials Reliability

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Acq. date: 2026-04-05

An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method

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