Publication:
An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method
Date
| dc.contributor.author | Zhou, L. | |
| dc.contributor.author | Bo, T. | |
| dc.contributor.author | Ji, Z. | |
| dc.contributor.author | Yang, H. | |
| dc.contributor.author | Xu, H. | |
| dc.contributor.author | Liu, Q. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Wang, X. | |
| dc.contributor.author | Ma, X. | |
| dc.contributor.author | Li, Y. | |
| dc.contributor.author | Yin, H. | |
| dc.contributor.author | Du, A. | |
| dc.contributor.author | Zhao, C. | |
| dc.contributor.author | Wang, W. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-29T09:04:19Z | |
| dc.date.available | 2021-10-29T09:04:19Z | |
| dc.date.issued | 2020 | |
| dc.identifier.issn | 1530-4388 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/36414 | |
| dc.identifier.url | https://ieeexplore.ieee.org/document/8952660 | |
| dc.source.beginpage | 92 | |
| dc.source.endpage | 96 | |
| dc.source.issue | 1 | |
| dc.source.journal | IEEE Transactions on Device and Materials Reliability | |
| dc.source.volume | 20 | |
| dc.title | An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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