Browsing by author "Ma, J."

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AC NBTI of Ge pMOSFETs: impact of energy alternating defects on lifetime prediction

Ma, J.; Zhang, W.; Zhang, J.F.; Ji, Z.; Benbakhti, B.; Franco, Jacopo; Mitard, Jerome; Witters, Liesbeth; Collaert, Nadine; Groeseneken, Guido (2015)
Characterization of negative-bias temperature instability of Ge MOSFETs with GeO2/Al2O3 stack

Ma, J.; Zhang, J.F.; Ji, Zhigang; Benbakhti, Brahim; Zhang, Wei Dong; Zheng, Xue Feng; Mitard, Jerome; Kaczer, Ben; Groeseneken, Guido; Hall, S.; Robertson, J.; Chalker, P. (2014)