AC NBTI of Ge pMOSFETs: impact of energy alternating defects on lifetime prediction

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Authors
Ma, J.; Zhang, W.; Zhang, J.F.; Ji, Z.; Benbakhti, B.; Franco, Jacopo; Mitard, Jerome; Witters, Liesbeth; Collaert, Nadine; Groeseneken, Guido
Conference
IEEE Symposium on VLSI Technology
Title
AC NBTI of Ge pMOSFETs: impact of energy alternating defects on lifetime prediction
Publication type
Proceedings paper
Embargo date
9999-12-31
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