Publication:
AC NBTI of Ge pMOSFETs: impact of energy alternating defects on lifetime prediction
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1915 since deposited on 2021-10-22
Acq. date: 2026-02-26
Citations
Statistics
Views
1915 since deposited on 2021-10-22
Acq. date: 2026-02-26
Citations