Publication:
AC NBTI of Ge pMOSFETs: impact of energy alternating defects on lifetime prediction
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1917 since deposited on 2021-10-22
1last month
Acq. date: 2026-05-02
Citations
Statistics
Views
1917 since deposited on 2021-10-22
1last month
Acq. date: 2026-05-02
Citations