Browsing by author "Stals, Lambert"
Now showing items 1-4 of 4
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Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics
De Schepper, Luc; De Ceuninck, Ward; Lekens, Geert; Stals, Lambert; Vanhecke, Bruno; Roggen, Jean; Beyne, Eric; Tielemans, Luc (1994) -
Electrical characterisation and reliability studies of thick film gas sensor structures
Czech, Ingrid; Manca, Jean; Roggen, Jean; Huyberechts, Guido; Stals, Lambert; De Schepper, Luc (1996) -
Electrical field induced ageing of polymer light-emitting diodes in an oxygen-rich atmosphere studied by emission microscopy, scanning electron microscopy and secondary ion mass spectroscopy
Bijnens, W.; De Wolf, Ingrid; Manca, Jean; D'Haen, Jan; Wu, Ting-Di; D'Olieslaeger, Marc; Beyne, Eric; Kiebooms, R.; Vanderzande, Dirk; Gelan, J.; De Ceuninck, Ward; De Schepper, Luc; Stals, Lambert (1998) -
On the deposition and characterisation of thin SnO2 films
Czech, Ingrid; Roggen, Jean; De Schepper, Luc; Huyberechts, Guido; Stals, Lambert (1996)