Authors

De Schepper, Luc; De Ceuninck, Ward; Lekens, Geert; Stals, Lambert; Vanhecke, Bruno; Roggen, Jean; Beyne, Eric; Tielemans, Luc

Issue

1

Journal

Quality and Reliability Engineering International

Volume

10

Title

Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics

Publication type

Journal article

Embargo date

9999-12-31