Publication:

Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics

Date

1994
Journal article
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dc.contributor.authorDe Schepper, Luc
dc.contributor.authorDe Ceuninck, Ward
dc.contributor.authorLekens, Geert
dc.contributor.authorStals, Lambert
dc.contributor.authorVanhecke, Bruno
dc.contributor.authorRoggen, Jean
dc.contributor.authorBeyne, Eric
dc.contributor.authorTielemans, Luc
dc.contributor.imecauthorDe Ceuninck, Ward
dc.contributor.imecauthorLekens, Geert
dc.contributor.imecauthorBeyne, Eric
dc.date.accessioned2021-09-29T12:40:43Z
dc.date.available2021-09-29T12:40:43Z
dc.date.embargo9999-12-31
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/123
dc.source.beginpage15
dc.source.endpage26
dc.source.issue1
dc.source.journalQuality and Reliability Engineering International
dc.source.volume10
dc.title

Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics

dc.typeJournal article
dspace.entity.typePublication
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