Browsing by author "Zhu, Huilong"
Now showing items 1-3 of 3
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Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs
Chang, Hao; Zhang, Yongkui; Zhou, Longda; Ji, Zhigang; Yang, Hong; Liu, Qianqian; Li, Yongliang; Liang, Renrong; Simoen, Eddy; Zhu, Huilong; Luo, Jun; Wang, Wenwu (2021) -
Impact of ALD TiN capping layer on interface trap and channel hot carrier reliability of HKMG nMOSFETs
Yang, Hong; Luo, Weichun; Zhou, Longda; Xu, Hao; Tang, Bo; Simoen, Eddy; Yin, Huaxiang; Zhu, Huilong; Zhao, Chao; Wang, Wenwu; Ye, Tianchun (2018) -
Physical mechanism underlying the time exponent shift in the ultra-fast NBTI of high-k/metal gated p-CMOSFETs
Zhou, Longda; Tang, Bo; Yang, Ho; Xu, Hao; Li, Yongliang; Simoen, Eddy; Yin, Huaxiang; Zhu, Huilong; Zhao, Chao; Wang, Wenwu; Chen, Dapeng; Ye, Tianchun (2018)