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Physical mechanism underlying the time exponent shift in the ultra-fast NBTI of high-k/metal gated p-CMOSFETs
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Authors
Zhou, Longda
;
Tang, Bo
;
Yang, Ho
;
Xu, Hao
;
Li, Yongliang
;
Simoen, Eddy
;
Yin, Huaxiang
;
Zhu, Huilong
;
Zhao, Chao
;
Wang, Wenwu
;
Chen, Dapeng
;
Ye, Tianchun
Conference
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA
Title
Physical mechanism underlying the time exponent shift in the ultra-fast NBTI of high-k/metal gated p-CMOSFETs
Publication type
Proceedings paper
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