Browsing by author "Vanleenhove, Anja"

Achieving reproducible data: examples from surface analysis in semiconductor technology

Conard, Thierry; van der Heide, Paul; Vanleenhove, Anja; Zborowski, Charlotte; Vandervorst, Wilfried (2019)

Advanced a-VMCO resistive switching memory through inner interface engineering with wide (>10²) on/off window, tunable μA-range switching current and excellent variability

Govoreanu, Bogdan; Di Piazza, Luca; Ma, Jigang; Conard, Thierry; Vanleenhove, Anja; Belmonte, Attilio; Radisic, Dunja; Popovici, Mihaela Ioana; Velea, Alin; Redolfi, Augusto; Richard, Olivier; Clima, Sergiu; Adelmann, Christoph; Bender, Hugo; Jurczak, Gosia (2016)

Buried interface and buried film analysis using lab-scale Haxpes instruments

Conard, Thierry; Zborowski, Charlotte; Vanleenhove, Anja; Hoflijk, Ilse; Vaesen, Inge; van der Heide, Paul (2021)

Characterization of patterned porous low-k dielectrics: surface sealing and residue removal by wet processing/cleaning

Le, Quoc Toan; Kesters, Els; Decoster, Stefan; Chan, BT; Nguyen, Mai Phuong; Conard, Thierry; Vanleenhove, Anja; Holsteyns, Frank; De Gendt, Stefan (2016)

Comparison and complementarity of Quases-Tougaard and Sessa applied to laboratory-based HAXPES spectra for the determination of the depth distribution

Zborowski, Charlotte; Conard, Thierry; Vanleenhove, Anja (2021)

Comparison and complementarity of QUASES-Tougaard and SESSA software

Zborowski, Charlotte; Vanleenhove, Anja; Conard, Thierry (2022)

Crystalline thin-foil silicon solar cells: where crystalline quality meets thin-film processing

Dross, Frederic; Baert, Kris; Bearda, Twan; Deckers, Jan; Depauw, Valerie; El Daif, Ounsi; Gordon, Ivan; Gougam, Adel; Govaerts, Jonathan; Granata, Stefano; Labie, Riet; Loozen, Xavier; Martini, Roberto; Masolin, Alex; O'Sullivan, Barry; Qiu, Yu; Vaes, Jan; Van Gestel, Dries; Van Hoeymissen, Jan; Vanleenhove, Anja; Van Nieuwenhuysen, Kris; Venkatachalam, Srisaran; Meuris, Marc; Poortmans, Jef (2012)