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Characterization of patterned porous low-k dielectrics: surface sealing and residue removal by wet processing/cleaning
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Authors
Le, Quoc Toan
;
Kesters, Els
;
Decoster, Stefan
;
Chan, BT
;
Nguyen, Mai Phuong
;
Conard, Thierry
;
Vanleenhove, Anja
;
Holsteyns, Frank
;
De Gendt, Stefan
ISSN
2162-8769
Issue
3
Journal
ECS Journal of Solid State Science and Technology
Volume
5
Title
Characterization of patterned porous low-k dielectrics: surface sealing and residue removal by wet processing/cleaning
Publication type
Journal article
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