Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Characterization of patterned porous low-k dielectrics: surface sealing and residue removal by wet processing/cleaning
Publication:
Characterization of patterned porous low-k dielectrics: surface sealing and residue removal by wet processing/cleaning
Copy permalink
Date
2016
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Le, Quoc Toan
;
Kesters, Els
;
Decoster, Stefan
;
Chan, BT
;
Nguyen, Mai Phuong
;
Conard, Thierry
;
Vanleenhove, Anja
;
Holsteyns, Frank
;
De Gendt, Stefan
Journal
ECS Journal of Solid State Science and Technology
Abstract
Description
Metrics
Views
1891
since deposited on 2021-10-23
Acq. date: 2025-12-10
Citations
Metrics
Views
1891
since deposited on 2021-10-23
Acq. date: 2025-12-10
Citations