Browsing by author "Schauer, P."

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Noise and THI reliability indicators for thin film resistors

Sikula, J.; Hruska, P.; Vasina, Petr; Schauer, P.; Kolarova, R.; Hajek, K.; Stadalnikas, A.; Palenskis, V.; Claeys, Cor; Simoen, Eddy (1996)