Browsing by author "Flannery, C."

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Comparison of techniques to characterise the density, porosity and elastic modulus of porous low-K SiO2 xerogel films

Murray, C.; Flannery, C.; Streiter, I.; Schulz, S. E.; Baklanov, Mikhaïl; Mogilnikov, K. P.; Himcinschi, C.; Friedrich, M.; Zahn, D. R. T.; Gessner, T. (2002)
Comparison of techniques to characterize the density, porosity and elastic modules of porous low-k SiO2 xerogel films

Murray, C.; Flannery, C.; Streiter, I.; Schulz, S. E.; Baklanov, Mikhaïl; Mogilnikov, K. P.; Himcinschi, C.; Friedrich, M.; Zahn, D. R. T.; Gessner, T. (2001)