Browsing by author "Caers, J."
Now showing items 1-6 of 6
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Optimal choice of the FEM damage volumes for estimation of the solder joint reliability for electronic package assemblies
Vandevelde, Bart; Gonzalez, Mario; Beyne, Eric; Zhang, G.Q.; Caers, J. (2003) -
Parameterised modelling of thermo-mechanical reliability for CSP assemblies
Vandevelde, Bart; Beyne, Eric; Zhang, K.G.Q.; Caers, J.; Vandepitte, D.; Baelmans, M. (2003) -
Parametrised modelling of thermo-mechanical reliability
Vandevelde, Bart; Beyne, Eric; Zhang, G. Q.; Caers, J. (2001) -
Solder parameter sensitivity for CSP life-time prediction using simulation-based optimization method
Vandevelde, Bart; Beyne, Eric; Zhang, K. G. Q.; Caers, J. (2001) -
Thermo-mechanical reliability optimisation of small sized SMD components
Vandevelde, Bart; Beyne, Eric; Roggen, Jean; Caers, J.; Van Veen, C. (1998) -
Thermo-mechanical reliability optimisation of small sized SMD components
Vandevelde, Bart; Beyne, Eric; Roggen, Jean; Caers, J.; Van Veen, C. (1999)