Thermo-mechanical reliability optimisation of small sized SMD components

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Authors

Vandevelde, Bart; Beyne, Eric; Roggen, Jean; Caers, J.; Van Veen, C.

Issue

2

Journal

VTE - Aufbau und Verbindungstechnik in der Electronik

Title

Thermo-mechanical reliability optimisation of small sized SMD components

Publication type

Journal article

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