Browsing by author "Bisi, D."
Now showing items 1-2 of 2
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Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulation
Marino, F.A.; Bisi, D.; Meneghini, M.; Verzellesi, G.; Zanoni, E.; Van Hove, Marleen; You, Shuzhen; Decoutere, Stefaan; Marcon, Denis; Stoffels, Steve; Ronchi, Nicolo; Meneghesso, G. (2015) -
Reverse-bias degradation of AlGaN/GaN vertical Schottky diodes: an investigation based on electrical and capacitive measurements
Meneghini, M.; Bertin, M.; Dal Santo, G.; Stocco, A.; Bisi, D.; Marcon, Denis; Malinowski, Pawel; Chini, A.; Menghesso, G.; Zanoni, E. (2012)