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Reverse-bias degradation of AlGaN/GaN vertical Schottky diodes: an investigation based on electrical and capacitive measurements
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1916 since deposited on 2021-10-20
2last month
Acq. date: 2025-12-11
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1916 since deposited on 2021-10-20
2last month
Acq. date: 2025-12-11
Citations