Publication:

Reverse-bias degradation of AlGaN/GaN vertical Schottky diodes: an investigation based on electrical and capacitive measurements

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1922 since deposited on 2021-10-20
1last month
1last week
Acq. date: 2026-08-06

Citations

Statistics

Views

1922 since deposited on 2021-10-20
1last month
1last week
Acq. date: 2026-08-06

Citations