Publication:
Reverse-bias degradation of AlGaN/GaN vertical Schottky diodes: an investigation based on electrical and capacitive measurements
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1920 since deposited on 2021-10-20
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Acq. date: 2026-01-25
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1920 since deposited on 2021-10-20
4last month
4last week
Acq. date: 2026-01-25
Citations