Browsing by author "Chen, Hua"
Now showing items 1-3 of 3
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Gate metal and cap layer effects on Ge nMOSFETs low frequency noise behavior
He, Liang; Zhao, Pan; Liu, Jiahao; Su, Yahui; Chen, Hua; Jia, Xiaofei; Arimura, Hiroaki; Mitard, Jerome; Witters, Liesbeth; Horiguchi, Naoto; Collaert, Nadine; Claeys, Cor; Simoen, Eddy (2019-12) -
Low frequency noise characterization of 22nm PMOS featuring with filling W gate using different precursors
He, Liang; Simoen, Eddy; Claeys, Cor; Wang, Guilei; Luo, Jun; Zhao, Chao; Li, Junfeng; Chen, Hua; Hu, Yin; Qin, Xiaoting (2017) -
RTS Noise Characterization of Trap Properties in InGaAs nFinFETs
Xiao, Xiaolei; He, Liang; Chen, Hua; Wang, Xianyu; Simoen, Eddy; Claeys, Cor (2023)