Gate metal and cap layer effects on Ge nMOSFETs low frequency noise behavior

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Authors

He, Liang; Zhao, Pan; Liu, Jiahao; Su, Yahui; Chen, Hua; Jia, Xiaofei; Arimura, Hiroaki; Mitard, Jerome; Witters, Liesbeth; Horiguchi, Naoto; Collaert, Nadine; Claeys, Cor; Simoen, Eddy

ISSN

0018-9383

Issue

2

Journal

IEEE Transactions on Electron Devices

Volume

66

Title

Gate metal and cap layer effects on Ge nMOSFETs low frequency noise behavior

Publication type

Journal article

Embargo date

9999-12-31

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