Publication:

Gate metal and cap layer effects on Ge nMOSFETs low frequency noise behavior

Date

2019
Journal article
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

39335.pdf 2.6 MB

Author(s)

He, Liang
;
Zhao, Pan
;
Liu, Jiahao
;
Su, Yahui
;
Chen, Hua
;
Jia, Xiaofei
;
Arimura, Hiroaki  
;
Mitard, Jerome  
;
Witters, Liesbeth  
;
Horiguchi, Naoto  
;
Collaert, Nadine  
;
Claeys, Cor
;
Simoen, Eddy  

Journal

IEEE Transactions on Electron Devices

Abstract

Description

Statistics

Views

1905 since deposited on 2021-10-27
3last month
2last week
Acq. date: 2026-10-10

Citations

Statistics

Views

1905 since deposited on 2021-10-27
3last month
2last week
Acq. date: 2026-10-10

Citations