Browsing by author "Nicoletti, Talitha"
Now showing items 1-9 of 9
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Advantages of different source/drain engineering on scaled UTBOX FD SOI nMOSFETs at high temperature operation
Nicoletti, Talitha; Dos Santos, Sara; Martino, Joao A.; Aoulaiche, Marc; Veloso, Anabela; Jurczak, Gosia; Simoen, Eddy; Claeys, Cor (2014) -
DIBL behavior of triple gate FinFETs with SEG on biaxial strained devices
Dos Santos, S.D.; Nicoletti, Talitha; Martino, J.A.; Simoen, Eddy; Claeys, Cor (2010) -
Floating body retention analysis for 1T-DRAM
Aoulaiche, Marc; Simoen, Eddy; Witters, Liesbeth; Claeys, Cor; Jurczak, Gosia; Nicoletti, Talitha; dos Santos, Sara; Martino, Jao Martino; Caillat, Christian; Fazan, Pierre (2013) -
Generation rate analysis of different S/D junction engineering in scalted UTBOX 1-T DRAM
Nicoletti, Talitha; Sasaki, Katia R.A.; dos Santos, Sara D.; Martino, Jao Antonio; Aoulaiche, Marc; Simoen, Eddy; Claeys, Cor (2013) -
Improved retention times in UTBOX nMOSFETs for 1T-DRAM applications
Sasaki, Katia; Nicoletti, Talitha; Almeida, Luciano; Dos Santos, Sara; Nissimoff, Albert; Aoulaiche, Marc; Simoen, Eddy; Claeys, Cor; Martino, Joao (2014) -
Junction field effect on the retention time for one-transistor floating-body RAM
Aoulaiche, Marc; Nicoletti, Talitha; Mendes Almeida, Luciano; Simoen, Eddy; Veloso, Anabela; Blomme, Pieter; Groeseneken, Guido; Jurczak, Gosia (2012) -
On the variability of the front-/back-channel LF noise in UTBOX SOI nMOSFETs
Dos Santos, Sara; Nicoletti, Talitha; Martino, Joao A.; Aoulaiche, Marc; Veloso, Anabela; Jurczak, Gosia; Simoen, Eddy; Claeys, Cor (2013) -
Origin of wide retention distribution in 1T Floating Body RAM
Aoulaiche, Marc; Nicoletti, Talitha; Veloso, Anabela; Roussel, Philippe; Simoen, Eddy; Claeys, Cor; Groeseneken, Guido; Jurczak, Gosia (2012) -
Potential and limitations of UTBB SOI for advanced CMOS technologies
Claeys, Cor; Aoulaiche, Marc; Simoen, Eddy; Nicoletti, Talitha; dos Dantos, Sara; Martino, Joao (2013)