DIBL behavior of triple gate FinFETs with SEG on biaxial strained devices

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Authors
Dos Santos, S.D.; Nicoletti, Talitha; Martino, J.A.; Simoen, Eddy; Claeys, Cor
Conference
Microelectronics Technology and Devices - SBMICRO 2010
Title
DIBL behavior of triple gate FinFETs with SEG on biaxial strained devices
Publication type
Proceedings paper
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