Browsing by author "Houdellier, Florent"
Now showing items 1-2 of 2
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Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy
Hüe, Florian; Hytch, Martin; Bender, Hugo; Houdellier, Florent; Claverie, Alain (2008) -
Strain mapping of tensile strained silicon transistors with embedded Si1yCy source and drain by dark-field holography
Hue, Florent; Hytch, Martin; Houdellier, Florent; Bender, Hugo; Claverie, Alain (2009)