Browsing by author "Neumann, J.T."
Now showing items 1-3 of 3
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Freeform illumination sources: an experimental study of source-mask optimization for 22nm SRAM cells
Bekaert, Joost; Laenens, Bart; Verhaegen, Staf; Van Look, Lieve; Trivkovic, Darko; Lazzarino, Frederic; Vandenberghe, Geert; Van Adrichem, Paul; Socha, Robert; Baron, S.; Tsai, M.-C.; Ning, K.; Hsu, S.; Liu, H.Y.; Mulder, M.; Bouma, A.; van der Heijden, E.; Mouraille, O.; Schreel, K.; Finders, Jo; Dusa, Mircea; Zimmerman, J.; Graeupner, Paul; Neumann, J.T.; Hennerkes, C. (2010) -
High-throughput multi-beam SEM: quantitative analysis of imaging capabilities at imec-N10 logic node
Neumann, J.T.; Garbowski, T.; Högele, W.; Korb, T.; Halder, Sandip; Leray, Philippe; Garreis, R.; le Maire, M.; Zeidler, D. (2017) -
Imaging semiconductor patterns at N10 logic node with a high-throughput multi-beam SEM
Neumann, J.T.; Garaboski, T.; Halder, Sandip; Leray, Philippe; Garreis, R.; Zeidler, D. (2016)