Browsing by author "Jain, Suresh"
Now showing items 21-40 of 71
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Finite element calculations to optimize the design of a stressor for strained induced quantum wires and quantum dots in GaAs
Pinardi, Kuntjoro; Jain, Suresh; Maes, Herman (1996) -
Growth and properties of strained Si1-x-yGexCylayers
Jain, Suresh; Osten, H. J.; Dietrich, B.; Rücker, H. (1995) -
High field effects on J/V characteristics in conducting polymers
Kumar, Vikram; Jain, Suresh; Kapoor, Ashok Kumar; Geens, Wim; Aernouts, Tom; Mehra, Anupama; Poortmans, Jef; Mertens, Robert; Willander, M. (2002) -
Hybrid and CMOS-based infrared detectors
Merken, Patrick; De Moor, Piet; John, Joachim; Zimmermann, Lars; Gastal, Martin; Jain, Suresh; Van Hoof, Chris (1999) -
Hybrid and CMOS-based infrared detectors
Merken, Patrick; De Moor, Piet; John, Joachim; Zimmermann, Lars; Gastal, Martin; Jain, Suresh; Van Hoof, Chris (2000) -
I-V characteristics of dark and illuminated PPV-PCBM blends solar cells
Jain, Suresh; Aernouts, Tom; Kapoor, A.K.; Kumar, V.; Geens, Wim; Poortmans, Jef; Mertens, Robert (2005-02) -
III-nitrides: growth, characterization, and properties
Jain, Suresh; Willander, M.; Narayan, J.; Van Overstraeten, Roger (2000) -
Influence of hydrogen on losses in silicon oxynitride planar optical waveguides
Sahu, B. S.; Agnihotri, Om Prakash; Jain, Suresh; Mertens, Robert; Kato, I. (2000) -
Influences of hydrogen on losses in silicon oxynitride planar optical waveguides
Sahu, B. S.; Agnihotri, Om Prakash; Jain, Suresh; Mertens, Robert; Nijs, Johan; Isamu, K. (2000) -
Injection- and space charge limited-currents in doped conducting organic materials
Jain, Suresh; Geens, Wim; Mehra, Anupama; Kumar, Vikram; Aernouts, Tom; Poortmans, Jef; Mertens, Robert; Willander, M. (2001) -
Material parameters for analytical and numerical modelling of Si and strained SiGe heterostructure devices
Jain, Suresh; Mehra, Anupama; Decoutere, Stefaan; Maes, Herman; Willander, M. (2001) -
Materials properties of (strained) SiGe layers
Poortmans, Jef; Jain, Suresh; Nijs, Johan; Van Overstraeten, Roger (1994) -
Measurement of nonuniform stresses in semiconductor films by optical methods
Pinardi, Kuntjoro; Jain, Suresh; Maes, Herman; Van Overstraeten, Roger; Willander, M.; Atkinson, A. (1997) -
Measurement of nonuniform stresses in semiconductors by the micro-Raman method
Pinardi, Kuntjoro; Jain, Suresh; Maes, Herman; Van Overstraeten, Roger; Willander, M.; Atkinson, A. (1998) -
Measurement of residual stress in thin films by using the optical microprobe
Atkinson, A.; Clarke, D. R.; Jain, Suresh; Pinardi, Kuntjoro; Webb, S. (1998) -
Mechanical and optical properties of selectively grown AlGaN stripes
Jain, Suresh; Pinardi, Kuntjoro; Maes, Herman; Willander, M. (1997) -
Misfit strain and misfit dislocations in lattice mismatched epitaxial layers and other systems
Jain, Suresh; Harker, A. H.; Cowley, R. A. (1997) -
Photoluminescence determination of the Fermi energy in heavily doped strained Si1-xGex layers
Libezny, Milan; Jain, Suresh; Poortmans, Jef; Caymax, Matty; Nijs, Johan; Mertens, Robert; Werner, K.; Balk, P. (1994) -
Raman spectra of Ge0.11Si0.89 strained quantum wires
Jain, Suresh; Pinardi, Kuntjoro; Maes, Herman; Van Overstraeten, Roger; Atkinson, A.; Willander, M. (1997) -
Semiconductor strained layers
Jain, Suresh; Maes, Herman; Van Overstraeten, Roger (1997)