Browsing by author "Hayama, Kiyoteru"
Now showing items 21-40 of 42
-
Irradiation Induced Lattice Defects in Si1-xGex Devices and Their Effect on Device Performance
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Poortmans, Jef; Caymax, Matty; Clauws, P. (1994) -
Irradiation induced lattice defects in Si1-xGex devices and their effect on device performance
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Poortmans, Jef; Caymax, Matty; Clauws, P. (1995) -
Irradiation induced lattice defects in Si1-xGex epitaxial devices
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Kudo, T.; Hakata, T.; Kobayashi, K.; Sunaga, H.; Poortmans, Jef; Caymax, Matty (1995) -
Lattice defects in Si1-xGex epitaxial diodes induced by 20-MeV alpha rays
Ohyama, Hidenori; Vanhellemont, Jan; Simoen, Eddy; Claeys, Cor; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Poortmans, Jef; Caymax, Matty (1997) -
Proton irradiation effects on the performance of Si1-xGex devices
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Tokyama, J.; Hakata, T.; Kudou, T.; Sunaga, H.; Nashiyama, I.; Uwatoko, Y.; Poortmans, Jef; Caymax, Matty (1996) -
Proton irradiation induced lattice defects in Si diodes and their effects on device performance
Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Kobayashi, K. (1997) -
Proton-irradiation effect on the electric-field enhancement of the generation lifetime in shallow p-n junction diodes
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Hayama, Kiyoteru; Kobayashi, K.; Ohyama, Hidenori (2001) -
Radiation damage in Si1-xGex heteroepitaxial devices
Ohyama, Hidenori; Hayama, Kiyoteru; Simoen, Eddy; Claeys, Cor; Poortmans, Jef; Caymax, Matty; Vanhellemont, Jan; Takami, Y.; Sunaga, H. (1997) -
Radiation damage in Si1-xGex heteroepitaxial devices
Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Vanhellemont, Jan; Hayama, Kiyoteru; Tokuyama, J.; Takami, Y.; Sunaga, H.; Poortmans, Jef; Caymax, Matty (1999) -
Radiation damage of n-MOSFETs fabricated in a BiCMOS process
Ohyama, Hidenori; Kobayashi, K.; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Takami, Y.; Yoneoka, M.; Hayama, Kiyoteru; Takizawa, H.; Kohiki, S. (2000) -
Radiation damage of N-MOSFETS fabricated in a BiCMOS process
Kobayashi, K.; Ohyama, Hidenori; Yoneoka, M.; Hayama, Kiyoteru; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Takami., Y.; Takizawa, H.; Kohiki, S. (2001) -
Radiation defects in Sti silicon diodes and their effects on device performance
Hayama, Kiyoteru; Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Poyai, Amporn; Miura, T.; Kobayashi, K. (2001) -
Radiation effects on n-MOSFETs fabricated in a BiCMOS process
Ohyama, Hidenori; Hayama, Kiyoteru; Ueda, A.; Simoen, Eddy; Claeys, C.; Nakabayashi, M.; Kobayashi, K. (2001) -
Radiation effects on polycrystalline silicon films
Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Hayama, Kiyoteru; Tanaka, K.; Kobayashi, K. (2001) -
Radiation effects on the current-voltage and capacitance- voltage characteristics of advanced P-N junction diodes surrounded by shallow trench isolation
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Hayama, Kiyoteru; Kobayashi, K.; Ohyama, Hidenori (2002) -
Radiation effects on the current-voltage and capacitance-voltage characteristics of advanced p-n junction diodes surrounded by shallow trench isolation
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Hayama, Kiyoteru; Kobayashi, K.; Ohyama, Hidenori (2001) -
Radiation performance of shallow trench isolation
Claeys, Cor; Simoen, Eddy; Poyai, Amporn; Hayama, Kiyoteru; Kobayashi, K.; Ohyama, Hidenori; Mohammadzadeh, A. (2000) -
Radiation source dependence of degradation and recovery of irradiated Si1-xGex epitaxial devices
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Poortmans, Jef; Caymax, Matty (1996) -
Radiation source dependence of degradation in shallow trench isolation diodes
Hayama, Kiyoteru; Ohyama, Hidenori; Kobayasi, K.; Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Takami, Y.; Takizawa, H.; Mohammadzadeh, A. (2000) -
Short-channel radiation effect in 60 MeV proton irradiated 0.13 μm CMOS transistors
Simoen, Eddy; Mercha, Abdelkarim; Morata, Alex; Hayama, Kiyoteru; Richardson, Geoffrey; Rafi, Joan Marc; Augendre, Emmanuel; Claeys, Cor; Mohammadzadeh, A.; Ohyama, H.; Romano-Rodriguez, A. (2002)