Browsing by author "Vandamme, Ewout"
Now showing items 21-34 of 34
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Low frequency noise analysis as a diagnostic tool to assess the quality of 0.25 μm Ti-silicided poly-lines..
Vandamme, Ewout; De Wolf, Ingrid; Lauwers, Anne; Vandamme, Lorenz (1998) -
Low frequency noise as a diagnostic tool for quality assessment for MOSFETs
Vandamme, Ewout; Claeys, Cor; Vandamme, L. (1994) -
Modeling 1/f noise and extraction of the SPICE noise parameters using a new extraction procedure
Van Heijningen, Marc; Vandamme, Ewout; Deferm, Ludo; Vandamme, Lorenz (1998) -
Modeling the subthreshold swing in MOSFET's
Vandamme, Ewout; Jansen, Philippe; Deferm, Ludo (1997) -
Optimisation of active area edge protection in shallow trench isolation
Augendre, Emmanuel; Rooyackers, Rita; Pochet, Sandrine; Grau, Lluis; Sleeckx, Erik; Vandamme, Ewout; Badenes, Gonçal (2001) -
Optimisation of critical parameters in a low cost, high performance deep submicron CMOS technology
Badenes, Gonçal; Perello, Carles; Rupp, Andreas; Vandamme, Ewout; Augendre, Emmanuel; Pochet, Sandrine; Deferm, Ludo (1999) -
Reliable extraction of RF figures-of-merit for MOSFETs
Vandamme, Ewout; Schreurs, Dominique; Nauwelaers, Bart; van Dinther, Cees; Badenes, Gonçal; Deferm, Ludo (1999) -
Technology optimisation and modelling of deep-submicron CMOS
Vandamme, Ewout (2001-02) -
The impact of Fe and Cu contamination in the 1012 at/cm2 range on the performance of junction diodes
Rotondaro, Antonio; Vandamme, Ewout; Vanhellemont, Jan; Simoen, Eddy; Heyns, Marc; Claeys, C. (1996) -
The potential and restrictions of the double derivative method for threshold voltage extraction in SOI MOSFETs
Simoen, Eddy; Vandamme, Ewout; Rotondaro, Antonio; Claeys, Cor (1994) -
Unsolved problemns on 1/f noise in MOSFETs and possible solutions
Vandamme, Ewout; Vandamme, Lorenz (1999) -
Unsolved problemns on 1/f noise in MOSFETs and possible solutions
Vandamme, Ewout; Vandamme, Lorenz (2000) -
Vectorial large signal RF for complete MOSFET model verification in time and frequency domain
Vandamme, Ewout; Schreurs, Dominique; van Dinther, Cees; Badenes, Gonçal; Deferm, Ludo (2000) -
Verification of non-linear MOSFET models by intermodulation measurements under loadpull conditions
Schreurs, Dominique; Vandamme, Ewout; Vandenberghe, S.; Carchon, Geert; Nauwelaers, Bart (2000)