Low frequency noise as a diagnostic tool for quality assessment for MOSFETs

Thumbnail
View/open
Metadata
Show full item record
Authors
Vandamme, Ewout; Claeys, Cor; Vandamme, L.
Conference
1st ELEN Workshop on Noise in Electronic Systems
Title
Low frequency noise as a diagnostic tool for quality assessment for MOSFETs
Publication type
Oral presentation
Embargo date
9999-12-31
Collections