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Low frequency noise as a diagnostic tool for quality assessment for MOSFETs
Publication:
Low frequency noise as a diagnostic tool for quality assessment for MOSFETs
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Date
1994
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406.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandamme, Ewout
;
Claeys, Cor
;
Vandamme, L.
Journal
Abstract
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2039
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Acq. date: 2025-12-16
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Metrics
Views
2039
since deposited on 2021-09-29
3
last month
1
last week
Acq. date: 2025-12-16
Citations